Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays

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Authors: Alessandro Grossi, Cristian Zambelli, Piero Olivo, Enrique Miranda, Valeriy Stikanov, Thomas Schroeder, Christian Walczyk, Christian Wenger

Journal title: 2015 IEEE International Memory Workshop (IMW)

Journal publisher: IEEE

Published year: 2015

Published pages: 1-4

DOI identifier: 10.1109/IMW.2015.7150303

ISBN: 978-1-4673-6933-6