Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays

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Authors: Felice Crupi, Francesco Filice, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Eduardo Perez, Christian Wenger

Journal title: IEEE Transactions on Device and Materials Reliability

Journal number: 16/3

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2016

Published pages: 413-418

DOI identifier: 10.1109/TDMR.2016.2594119

ISSN: 1530-4388