Increasing Reliability on UAV Fading Scenarios

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Authors: Joseanne Viana; Joao Madeira; null Nidhi; Pedro Sebastiao; Francisco Cercas; Albena Mihovska; Rui Dinis

Journal title: Viana , J , Madeira , J , .. , N , Sebastiao , P , Cercas , F , Mihovska , A & Dinis , R 2022 , ' Increasing Reliability on UAV Fading Scenarios ' , IEEE Access , vol. 10 , pp. 30959-30973 . https://doi.org/10.1109/ACCESS.2022.3149588

Journal number: 8

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2022

DOI identifier: 10.1109/access.2022.3149588

ISSN: 2169-3536