Increasing Reliability on UAV Fading Scenarios

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Authors: Joseanne Viana, João Madeira; Nidhi, Pedro Sebastião, Francisco Cercas, Albena Mihovska and Rui Dinis

Journal title: IEEE Access

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2022

DOI identifier: 10.1109/access.2022.3149588

ISSN: 2169-3536