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Authors: Jiawei Zhang, Lee Empringham, Liliana De Lillo, Patrick Wheeler, Cosimo Spagnolo
Journal title: IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society
Journal publisher: IEEE
Published year: 2018
Published pages: 859-864
DOI identifier: 10.1109/iecon.2018.8591701
ISBN: 978-1-5090-6684-1