Recovering Quantum Gates from Few Average Gate Fidelities

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Authors: I. Roth, R. Kueng, S. Kimmel, Y.-K. Liu, D. Gross, J. Eisert, M. Kliesch

Journal title: Physical Review Letters

Journal number: 121/17

Journal publisher: American Physical Society

Published year: 2018

Published pages: 170502

DOI identifier: 10.1103/physrevlett.121.170502

ISSN: 0031-9007