Defect depth-profiling in kesterite absorber by means of chemical etching and surface analysis

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Authors: Kunal J. Tiwari, Robert Fonoll Rubio, Sergio Giraldo, Lorenzo Calvo-Barrio, Victor Izquierdo-Roca, Marcel Placidi, Yudania Sanchez, Alejandro Pérez-Rodríguez, Edgardo Saucedo, Zacharie Jehl Li-Kao

Journal title: Applied Surface Science

Journal number: Volume 540, Part 2

Journal publisher: Elsevier BV

Published year: 2021

DOI identifier: 10.1016/j.apsusc.2020.148342

ISSN: 0169-4332