Vein-based Biometric Verification using Transfer Learning

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Authors: Ridvan Salih Kuzu, Emanuele Maiorana, Patrizio Campisi

Journal title: 2020 43rd International Conference on Telecommunications and Signal Processing (TSP)

Journal publisher: IEEE

Published year: 2020

Published pages: 403-409

DOI identifier: 10.1109/tsp49548.2020.9163491

ISBN: 978-1-7281-6376-5