Masking trapped charge in flash memories

Summary

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Authors: Antonia Wachter-Zeh, Eitan Yaakobi

Journal title: 2015 53rd Annual Allerton Conference on Communication, Control, and Computing (Allerton)

Journal publisher: IEEE

Published year: 2015

Published pages: 696-703

DOI identifier: 10.1109/ALLERTON.2015.7447072

ISBN: 978-1-5090-1824-6