Correctable Erasure Patterns in Product Topologies

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Authors: Lukas Holzbaur, Sven Puchinger, Eitan Yaakobi, Antonia Wachter-Zeh

Journal title: Proceedings of 2021 IEEE International Symposium on Information Theory

Journal publisher: IEEE

Published year: 2021

Published pages: 2054-2059

DOI identifier: 10.1109/isit45174.2021.9518208

ISBN: 9781538682098