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Authors: Hongbing Ding, Yiming Li, Chao Wang, Chuang Wen, Yuhe Tian
Journal title: IEEE Transactions on Instrumentation and Measurement
Journal number: 69/9
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2020
Published pages: 6465-6477
DOI identifier: 10.1109/tim.2020.2967130
ISSN: 0018-9456