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Authors: S. Diaham, L. O’Sullivan, E. Ceccarelli, P. Lambkin, J. O’Malley, J. Fitzgibbon, B. Stenson, P.J. Murphy, Y. Zhao, J. Cornett, A. Sow, B. Chen, S. Geary
Journal title: 3rd IEEE International Conference on Dielectrics (ICD)
Journal number: 1
Journal publisher: IEEE
Published year: 2020
DOI identifier: 10.1109/icd46958.2020.9341967