Summary
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Authors: D. Belver, J. Boix, E. Calvo, C. Cuesta, A. Gallego-Ros, I. Gil-Botella, S. Jimenez, C. Lastoria, T. Lux, I. Martin, J. J. Martinez, C. Palomares, J. Soto-Oton, A. Verdugo
Journal title: IEEE Transactions on Nuclear Science
Journal number: 68/9
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2021
Published pages: 2334-2341
DOI identifier: 10.1109/tns.2021.3095355
ISSN: 0018-9499