Digital Addiction: Negative Life Experiences and Potential for Technology-Assisted Solutions.

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Authors: Cham, S., Algashami, A., Aldhayan, M., McAlaney, J., Phalp, K. T., Almourad, M.B., Ali, R.

Journal title: WorldCist'19 - 7th World Conference on Information Systems and Technologies

Journal publisher: Springer

Published year: 2019

Published pages: 921-931