Using Orthogonal Defect Classification to characterize NoSQL database defects

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Authors: João Agnelo, Nuno Laranjeiro, Jorge Bernardino

Journal title: Journal of Systems and Software

Journal number: 159

Journal publisher: Elsevier BV

Published year: 2020

Published pages: 110451

DOI identifier: 10.1016/j.jss.2019.110451

ISSN: 0164-1212