Automating orthogonal defect classification using machine learning algorithms

Summary

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Authors: Fábio Lopes, João Agnelo, César A. Teixeira, Nuno Laranjeiro, Jorge Bernardino

Journal title: Future Generation Computer Systems

Journal number: 102

Journal publisher: Elsevier BV

Published year: 2020

Published pages: 932-947

DOI identifier: 10.1016/j.future.2019.09.009

ISSN: 0167-739X