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Authors: Elder Rodrigues, Leonardo Montecchi, Andrea Ceccarelli
Journal title: 2020 IEEE 31st International Symposium on Software Reliability Engineering (ISSRE)
Journal publisher: IEEE
Published year: 2020
Published pages: 414-425
DOI identifier: 10.1109/issre5003.2020.00046
ISBN: 978-1-7281-9870-5