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Authors: J. M. Haut; M. E. Paoletti; S. Moreno; J. Plaza; J. A. Rico; A. Plaza
Journal title: Proceedings of the IEEE
Journal number: 1
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2021
DOI identifier: 10.5281/zenodo.6413871
ISSN: 0018-9219