Pulsed Infrared Thermography Failure Analysis of low-emissivity Specimens without contaminations caused by high-emissivity coatings

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: D. R. Wargulski; D. May; J. Petrick; R. Schacht; B. Wunderle; M. Abo Ras All Authors

Journal title: International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)

Journal number: 26th

Journal publisher: IEEE

Published year: 2020

DOI identifier: 10.1109/therminic49743.2020.9420531

ISBN: 978-1-7281-7643-7