An In-line Failure Analysis System Based on IR Thermography Ready for Production Line Integration

Summary

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Authors: Dan R. Wargulski; Daniel May; Florian Löffler; Torsten Nowak; Jan Petrick; Corinna Grosse; Bernhard Wunderle; Eef Boschman; Mohamad Abo Ras

Journal title: International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)

Journal number: 25th

Journal publisher: IEEE

Published year: 2019

DOI identifier: 10.1109/therminic.2019.8923598

ISBN: 978-1-7281-2078-2