Inline failure analysis of electronic components by infrared thermography without high-emissivity spray coatings

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Authors: Dan R. Wargulski; Daniel May; Eef Boschman; Aaron Hutzler; Bernhard Wunderle; Mohamad Abo Ras

Journal title: Electronics System-Integration Technology Conference (ESTC)

Journal number: 8th

Journal publisher: IEEE

Published year: 2020

DOI identifier: 10.1109/estc48849.2020.9229787

ISBN: 978-1-7281-6293-5