Summary
This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.
Authors: Xuan Li, Nathan Youngblood, Wen Zhou, Johannes Feldmann, Jacob Swett, Samarth Aggarwal, A. Sebastian, C. David Wright, Wolfram Pernice, Harish Bhaskaran
Journal title: 2020 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2020
Published pages: 7.5.1-7.5.4
DOI identifier: 10.1109/iedm13553.2020.9372052
ISBN: 978-1-7281-8888-1