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Authors: Fernandes dos Santos, Fernando; Malde, Sujit; Cazzaniga, Carlo; Frost, Chris; Carro, Luigi; Rech, Paolo
Journal title: IEEE Transactions on Nuclear Science
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.1109/tns.2022.3141341
ISSN: 0018-9499