Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits

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Authors: Samuel, Pagliarini Luis, Benites Mayler, Martins RECH, PAOLO Fernanda, Kastensmidt

Journal title: IEEE Transactions on Nuclear Science

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

DOI identifier: 10.1109/tns.2021.3070643

ISSN: 0018-9499