Soft Error Effects on Arm Microprocessors: Early Estimations vs. Chip Measurements

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Authors: Bodman, Pablo; Papadimitriou, George; Rech, Rubens Luiz Junior; Gizopoulos, Dimitris; Rech, Paolo

Journal title: IEEE Transactions on Computers

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2022

DOI identifier: 10.1109/tc.2021.3128501

ISSN: 0018-9340