Two‐Ray Reflection Resolution Algorithm for Planar Material Electromagnetic Property Measurement at the Millimeter‐Wave Bands

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Authors: Jiliang Zhang, Xi Liao, Andrés Alayón Glazunov, Yu Shao, Yang Wang, Xiaoli Chu, Jie Zhang

Journal title: Radio Science

Journal number: 55/3

Journal publisher: American Geophysical Union

Published year: 2020

DOI identifier: 10.1029/2019rs006944

ISSN: 0048-6604