Low-Frequency Admittance of Capacitor with Working Substance “Insulator–Partially Disordered Semiconductor– Insulator”

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Authors: N. A. Poklonski, I. I. Anikeev, S. A. Vyrko

Journal title: Devices and Methods of Measurements

Journal number: 12/3

Journal publisher: Belarusian National Technical University

Published year: 2021

Published pages: 202-210

DOI identifier: 10.21122/2220-9506-2021-12-3-202-210

ISSN: 2414-0473