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Authors: J. Huang; C. -X. Wang; Y. Sun; R. Feng; J. Huang; B. Guo; Z. Zhong; T. J. Cui
Journal title: Proceedings of the IEEE
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.1109/jproc.2022.3186087
ISSN: 0018-9219
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