Cycle-Consistent Adversarial Networks and Faster Adaptive Bi-dimensional Empirical Mode Decomposition for Style Transfer

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Authors: Elissavet Batziou, Petros Alvanitopoulos, Konstantinos Ioannidis, Ioannis Patras, Stefanos Vrochidis and Ioannis Kompatsiaris

Journal publisher: International Conference on Pattern Recognition

Published year: 2021