Monolithically Integrated Wavelength-meter in InP with measurement bandwidth of 100nm centered on the C band

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Authors: Andrea Volpini, Damiano Massella, David Alvarez-Outerelo, Francisco Soares, Francisco J.Diaz-Otero

Journal title: IEEE Photonics Benelux

Journal publisher: arXiv

Published year: 2021

DOI identifier: 10.48550/arxiv.2301.03657

ISSN: 2331-8422