Design of a Wavelength-Meter with Measurement Range up to 100nm and 8 pm precisión

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Francisco J. Diaz-Otero, Francisco Soares, Damiano Massella, Andrea Volpini, Marcin Zyskowski

Journal title: IEEE Photonics Benelux

Journal publisher: TechRxiv

Published year: 2021

DOI identifier: 10.36227/techrxiv.21840483.v1