Extending the Best Linear Approximation Framework to the Process Noise Case

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Authors: Schoukens, Maarten; Pintelon, Rik; Dobrowiecki, Tadeusz P.; Schoukens, Johan

Journal title: IEEE Transactions on Automatic Control

Journal number: 65

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 1514-1524

DOI identifier: 10.1109/tac.2019.2923038

ISSN: 0018-9286