Robust malfunction diagnosis in process industry time series

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Authors: T. Vafeiadis, S. Krinidis, C. Ziogou, D. Ioannidis, S. Voutetakis, D. Tzovaras

Journal title: IEEE International Conference on Industrial Informatics

Journal number: INDIN 2016

Journal publisher: IEEE

Published year: 2016

Published pages: 6