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Authors: Yukui Cai, Zongwei Xu, Hong Wang, King Hang Aaron Lau, Fei Ding, Jining Sun, Yi Qin, Xichun Luo
Journal title: Nanomanufacturing and Metrology
Journal number: 2/3
Journal publisher: Springer
Published year: 2019
Published pages: 148-159
DOI identifier: 10.1007/s41871-019-00046-2
ISSN: 2520-811X