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Authors: Yunlei Shi; Zhaopeng Chen; Yansong Wu; Dimitri Henkel; Sebastian Riedel; Hongxu Liu; Qian Feng; Jianwei Zhang
Journal title: Crossref
Journal number: 2
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/iros51168.2021.9636417
ISBN: 978-1-6654-1715-0