Thickness-Dependent Exciton Dynamics in Thermally Evaporated Rubrene Thin Films

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Authors: Chia-Hsun Chen, Pin-Hao Sher, Cheng-Pin Chen, Wing-Kit Choi, Christopher J. Bardeen, Tien-Lung Chiu, Juen-Kai Wang, Jiun-Haw Lee

Journal title: The Journal of Physical Chemistry C

Journal number: 124/47

Journal publisher: American Chemical Society

Published year: 2020

Published pages: 25729-25737

DOI identifier: 10.1021/acs.jpcc.0c07887

ISSN: 1932-7447