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Authors: Uri Shani, Marco Franke, Karl A. Hribernik, Klaus-Dieter Thoben
Journal title: 2017 Annual IEEE International Systems Conference (SysCon)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-7
DOI identifier: 10.1109/SYSCON.2017.7934810
ISBN:978-1-5090-4623-2
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