Summary
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Authors: Sarah Bechtle, Artem Molchanov, Yevgen Chebotar, Edward Grefenstette, Ludovic Righetti, Gaurav Sukhatme, Franziska Meier
Journal title: 25th International Conference on Pattern Recognition
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/icpr48806.2021.9412010
