Summary
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Authors: Daeun Song; Pierre Fernbach; Thomas Flayols; Andrea Del Prete; Nicolas Mansard; Steve Tonneau; Young J. Kim
Journal title: https://hal.laas.fr/hal-03435135
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/lra.2021.3088797
ISSN: 2377-3766
