Short Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturing

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Authors: Elpiniki I. Papageorgiou, Theodosis Theodosiou, George Margetis, Nikolaos Dimitriou, Paschalis Charalampous, Dimitrios Tzovaras, Ioannis Samakovlis

Journal title: International Conference on Information, Intelligence, Systems and Applications (IISA)

Journal number: 1

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/iisa52424.2021.9555499