A Twin Error Gauge for Kaczmarz's Iterations

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Authors: Bart S. van Lith, Per Christian Hansen, Michiel E. Hochstenbach

Journal title: SIAM Journal on Scientific Computing

Journal publisher: Society for Industrial and Applied Mathematics

Published year: 2021

Published pages: S173-S199

DOI identifier: 10.1137/20m1349011

ISSN: 1064-8275