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Authors: Giuseppe Schiavone, Florian Fallegger, Philipp Schonle, Qiuting Huang, Stephanie P. Lacour
Journal title: 2019 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2019
Published pages: 10.2.1-10.2.4
DOI identifier: 10.1109/iedm19573.2019.8993503
ISBN: 978-1-7281-4032-2