Distributed MIMO for Li-Fi: Channel Measurements, Ray Tracing and Throughput Analysis

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Authors: Hossien B. Eldeeb; S. M. Mana; V. Jungnickel; P. Hellwig; J. Hilt; M. Uysal

Journal title: IEEE Photonic Technology Letters

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/lpt.2021.3072254

ISSN: 1941-0174