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Authors: Hossien B. Eldeeb; M. Hosney; H. M. Elsayed; R. I. Badr; M. Uysal; H. A. Selmy
Journal title: IEEE Access
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2020
DOI identifier: 10.1109/access.2020.3036616
ISSN: 2169-3536