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Authors: J. A. M. Fordyce, D. A. Díaz-Thomas, T. Piwonski, A. N. Baranov, L. O’Faolain, and L. Cerutti1
Journal title: Compound Semiconductor Week 2022
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/csw55288.2022.9930442
ISBN: 978-1-6654-5340-0
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