Reliability Evaluation of Voltage Source Converters for MVDC Applications

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Authors: Gayan Abeynayake, Gen Li, Tibin Joseph, Wenlong Ming, Jun Liang, Andrew Moon, Kevin Smith, James Yu

Journal title: 2019 IEEE Innovative Smart Grid Technologies - Asia (ISGT Asia)

Journal publisher: IEEE

Published year: 2019

Published pages: 2566-2570

DOI identifier: 10.1109/isgt-asia.2019.8881326

ISBN: 978-1-7281-3520-5