Application of a Testing-to-Failure Approach to the Susceptibility Assessment of Electronic Systems

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Authors: Xinting Xue, Tim Claeys, Davy Pissoort

Journal title: Proceedings of the 2023 International Symposium on Electromagnetic Compatibility – EMC Europe

Journal number: yearly

Journal publisher: IEEE

Published year: 2023

Published pages: 6

DOI identifier: 10.1109/emceurope57790.2023.10274213