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Authors: Simón Rendón Vélez (first author); Ridvan Aba (second author); Mark J. A. M. van Helvoort; Bärbel van den Berg; Robert Vogt-Ardatjew; Frank Leferink
Journal title: Proceedings of the 2023 International Symposium on Electromagnetic Compatibility – EMC Europe
Journal number: yearly
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/emceurope57790.2023.10274349
ISBN: 979-8-3503-2400-6