Effective attenuation length of keV photoelectrons in silicon measured by transmission through thin membranes

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Authors: Vladyslav Solokha, Tien-Lin Lee, Axel Wilson, Kurt Hingerl, Jörg Zegenhagen

Journal title: Journal of Electron Spectroscopy and Related Phenomena

Journal number: 225

Journal publisher: Elsevier BV

Published year: 2018

Published pages: 28-35

DOI identifier: 10.1016/j.elspec.2018.03.003

ISSN: 0368-2048