In situ time-of-flight mass spectrometry of ionic fragments induced by focused electron beam irradiation: Investigation of electron driven surface chemistry inside an SEM under high vacuum

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Authors: Jurczyk, Jakub; Pillatsch, Lex; Berger, Luisa; Priebe, Agnieszka; Madajska, Katarzyna; Kapusta, Czeslaw; Szymanska, Iwona B.; Michler, Johann; Utke, Ivo

Journal title: Nanomaterials

Journal number: 12 (15)

Journal publisher: MDPI

Published year: 2022

Published pages: 2710

DOI identifier: 10.3390/nano12152710

ISSN: 2079-4991